Learning Forum

[johnny_hsiao]

https://optics.ansys.com/hc/en-us/articles/360041780494-Defect-on-a-metal-surface

1)_The illumination in this article is assumed to be a focused spot rather than illumination over a specific area. Are there any other articles that use standard image calculation with illumination over a specific area?

2)_The EP, ES and Ex,Ey transformation confused me. Please see the description below.

Why is the transformation matrix multiplied again in line 191 & 192.

[Guilin Sun]

This example uses plane wave and periodic-type BCs so it is for periodic structure. If you want to simulate non-periodic structure you can use Gaussian beam.

For the script, Lines 172~175 are not Ex,Ey. The subscripts xy are meant for incident xy polarization.

 

[johnny_hsiao]

1)_I would like to use the S matrix calculation method to simulate defects. I referred to another topic "Optical-Defect-Metrology-S-Matrix", but that optical imaging is mainly based on a scanning spot. So I am trying to modify it to a standard image calculation method, and researching how to write the script and looking for related articles.

2)_If lines 172~175 are not Ex,Ey. What is the input_factor0_(xS, xP, yS, yP) mean? I thought that is transform matrix between Es, Ep and Ex, Ey.

[Guilin Sun]

Maybe you can visit the original example to get clear understanding: https://optics.ansys.com/hc/en-us/articles/360041768554-Optical-Defect-Metrology-S-Matrix

The first transformation is for input filter, and the second one is for output filter.