-
-
May 18, 2022 at 2:02 pm
Odebowale
SubscriberI have calculated S- parameters in FDTD and imported it to interconnect. I used two methods to compare my results. Firstly, I calculated s-parameters for each of the layers and extracted it to interconnect. For the second method, I extracted s-parameters for the whole structure once and exported it to interconnect. However, the results of transmission plots are not the same.
Is there away I can visualize reflectance for my design as well in interconnect?
Attached are screenshots of the two results:
May 19, 2022 at 4:01 amGWANG
Ansys EmployeeHi Odebowale
To visualize the reflection, you may setup ONA with 2 input ports, then connect the second input port to "port 1" of your s-parameter. In this case when you excite light to "port 1" of the s-parameter element, the reflection to this port itself can be measured.
May 19, 2022 at 4:09 amOdebowale
SubscriberThanks so much. This answer my first question
Please do you have idea on how I can combine two or more s-parameters elements? I fill like the way it is connected above is not correct because there should be "multiplier" to combine each of s-parameter elements. Any idea will be much appreciated
Viewing 2 reply threads- The topic ‘How can I calculate S-parameters for four layered design in interconnect?’ is closed to new replies.
Ansys Innovation SpaceTrending discussionsTop Contributors-
3467
-
1057
-
1051
-
918
-
896
Top Rated Tags© 2025 Copyright ANSYS, Inc. All rights reserved.
Ansys does not support the usage of unauthorized Ansys software. Please visit www.ansys.com to obtain an official distribution.
-
The Ansys Learning Forum is a public forum. You are prohibited from providing (i) information that is confidential to You, your employer, or any third party, (ii) Personal Data or individually identifiable health information, (iii) any information that is U.S. Government Classified, Controlled Unclassified Information, International Traffic in Arms Regulators (ITAR) or Export Administration Regulators (EAR) controlled or otherwise have been determined by the United States Government or by a foreign government to require protection against unauthorized disclosure for reasons of national security, or (iv) topics or information restricted by the People's Republic of China data protection and privacy laws.