-
-
September 16, 2022 at 1:06 am2212296Subscriber
Hi guys! In a recent question, I learned that thin films can go on to measure refractive transmittance by the 'stackrt' method.
Question: 'stackrt' method compared to regular method
- The difference between the scope of use of the two (which case is applicable)
- Is there any difference between the measurement results of the two?
-
September 16, 2022 at 1:51 amGuilin SunAnsys Employee
stackrt is an analytical solution for thin-film type of devices : https://optics.ansys.com/hc/en-us/articles/360034406254-stackrt-Script-command
You can compare some simple analytical results such as a cavity that many textbooks have formulas that you can use.
Â
-
Viewing 1 reply thread
- The topic ‘About Thin Film Simulation (FDTD)’ is closed to new replies.
Ansys Innovation Space
Trending discussions
- Difference between answers in version 2024 and 2017 lumerical mode solution
- Errors Running Ring Modulator Example on Cluster
- INTERCONNECT – No results unless rerun simulation until it gives any
- Import material .txt file with script
- Help for qINTERCONNECT
- Trapezoidal ring
- Issues with getting result from interconnent analysis script
- How to measure transmission coefficients on a given plane .
- Topology Optimization Error
- Absorption cross-section of AuNR excited by prism-based TIR
Top Contributors
-
1301
-
591
-
544
-
524
-
366
Top Rated Tags
© 2025 Copyright ANSYS, Inc. All rights reserved.
Ansys does not support the usage of unauthorized Ansys software. Please visit www.ansys.com to obtain an official distribution.