Learning Forum

[Chu Huy Hoang]

Dear Mr. Guilin Sun

 

Thank you for your reply.

 

What I want to simulate is the phase change upon reflection of multiple thin film stacks in FDTD. The phase change will be the combined phase, including a linear term and a nonlinear term. I am interested in the nonlinear term because I will compare this nonlinear phase change to the nonlinear phase extracted from the coherence scanning interferometer signal. 

I successfully extracted the phase change for a simple structure and showed the same result with the reference paper (Figure 1). However, when I tried to simulate more layers (Figure 2), the result from the FDTD simulation differed from the experiment (Figure 2). The structure I simulated in Figure 2 is illustrated in Figure 3, and the FDTD setup is in Figure 4. I am not sure whether the light source or the absence of the Cu surface makes the simulation result differ. 

Figure 1

Figure 2

Figure 3

Figure 4