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April 16, 2024 at 6:58 am
9181040g0835
Subscriber在案例简化显微成像 – Ansys Optics中,microscopy_imaging.lsf执行了farfieldvector3d函数
来获取远场投影后的电场强度E,然后最后再通过chirp-z变换来进行成像,但是案例光学缺陷测量(直接仿真) – Ansys Optics中的成像函数却采用了farfield3d函数直接进行成像
。想请问一下老师这两种方式有什么区别,在进行显微成像的过程中该如何选择呢?
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April 17, 2024 at 6:53 pm
Guilin Sun
Ansys Employeefarfield3d函数结果是强度Projects a given power or field profile monitor or a rectilinear dataset to the far field in a 3D simulation. The electric field intensity |E| 2 is returned.
而farfieldvector3d函数结果是场The function farfieldvector3d is similar to farfield3d, but it returns the complex electric fields, rather than field intensity.
关键看你想要什么结果,你再阅读一下两个例子的脚本。
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