Learning Forum

[yadong.wang]

Hi there,

Maybe I found a bug. I use the diagonal refractive index of materials with dispersion and loss. When setting the FDTD or RCWA, I use light source with z direction and back emission, corresponding to the nx, ny, nz of the materials to the setting x, y, z axis in lumerical.

The problem is that I cannot get a correct result till I define nz'=nz, and ny'=ny, exchanging y and z axis basically. I am confused to this result. 

Maybe I am wrong at some points. 

Could anyone help? I am happy to talk or set a zoom meeting. Thanks a lot!

[Guilin Sun]

"The problem is that I cannot get a correct result till I define nz'=nz, and ny'=ny, exchanging y and z axis basically. I am confused to this result. "

I am not sure if this is what you really mean. Maybe ny'=nz, and nz'=ny?

I would suggest that you use thin-film type structure and use stackrt for verification stackrt - Script command which is an analytical solution. Then you can compare it with results from FDTD and RCWA.

For further questions, please post it in the Photonics forum: /forum/forums/forum/discuss-simulation/photonics/