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May 3, 2024 at 10:06 pm
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Changing PML conditions doesn't affect the results of the FDTD simulations. On the other hand, I would expect that reducing mesh would affect the simulation results. The Si pillar is 850 nm-tall, and running it with 4 nm-mesh on 40 cores takes many hours. I am wondering if the change in FDTD result primarily comes from the different geometrical sampling.
- Is there a straightforward way to ensure that the geometry of the structure does not change when I change the mesh?
- My understanding is that introducing and external mesh object in the RCWA simulation does not influence the simulation results. Is that correct?
- In the future, I plan to add thin material layers in my RCWA simulation. These layers can be as thin as 0.8 nm. If my question 2 is correct, how can I ensure that the field is properly resolved in these ultrathin layers?
Thanks!