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October 19, 2021 at 6:17 am
TJSN13579
Subscriber请问FDTD当中如何同时扫描波长和光源的入射角度,得到电场随波长和光源的入射角度的变化情况?
October 19, 2021 at 3:32 pmGuilin Sun
Ansys Employee同时扫描波长和光源的入射角度还是嵌套扫描?
应该用Sweep的功能:
Creating nested parameter sweeps
在扫描之前,需要做一些设置,参见 Ansys Insight: 扫描波长时如何设置网格、材料拟合和监视器
这样才能保证材料和网格不改变,后者对于提取电场至关重要,否则网格改变将无法提取结果,因为要形成特定的矩阵。
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