{"id":198280,"date":"2026-04-14T10:58:16","date_gmt":"2026-04-14T10:58:16","guid":{"rendered":"https:\/\/innovationspace.ansys.com\/knowledge\/forums\/topic\/ansys-medini-solutions-for-iso-26262-in-semiconductors\/"},"modified":"2026-04-15T09:49:53","modified_gmt":"2026-04-15T09:49:53","slug":"ansys-medini-solutions-for-iso-26262-in-semiconductors","status":"publish","type":"topic","link":"https:\/\/innovationspace.ansys.com\/knowledge\/forums\/topic\/ansys-medini-solutions-for-iso-26262-in-semiconductors\/","title":{"rendered":"Ansys medini solutions for ISO 26262 in Semiconductors"},"content":{"rendered":"<p><a href=\"https:\/\/ansys13.ansys.com\/AnsysInnovationCourses\/KnowledgeArticles\/Medini\/Datasheet\/ansys-medini-analyze-for-semiconductors.pdf\">ansys-medini-analyze-for-semiconductors.pdf<\/a><\/p>\n<p>Ansys medini analyze\u00a0helps semiconductor manufacturers in the automotive domain with dedicated ISO 26262 support.<\/p>\n","protected":false},"template":"","class_list":["post-198280","topic","type-topic","status-publish","hentry","topic-tag-medini-analyze"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_wp_page_template":["default"],"_bbp_forum_id":["198276"],"_bbp_topic_id":["198317"],"_bbp_last_active_time":[""],"_bbp_author_ip":[""],"_btv_view_count":["22"],"_edit_lock":["1776247199:13198"],"_edit_last":["13198"],"_aioseo_title":[null],"_aioseo_description":[null],"_aioseo_keywords":["a:0:{}"],"_aioseo_og_title":[null],"_aioseo_og_description":[null],"_aioseo_og_article_section":[""],"_aioseo_og_article_tags":["a:0:{}"],"_aioseo_twitter_title":[null],"_aioseo_twitter_description":[null],"filter_by_optics_product":["Lumerical"],"_filter_by_optics_product":["field_64fb192ba3121"],"application_name":[""],"_application_name":["field_64a80903c8e15"],"family":[""],"_family":["field_64a809229a857"],"siebel_km_number":[""],"_siebel_km_number":["field_63ecbffce60db"],"salesforce_km_number":[""],"_salesforce_km_number":["field_63ecc018e60dc"],"km_published_date":[""],"_km_published_date":["field_64c77704499dd"],"product_version":[""],"_product_version":["field_64c776cb4fd2e"]},"test":"articlesansys-com"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/198280","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":1,"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/198280\/revisions"}],"predecessor-version":[{"id":198317,"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/198280\/revisions\/198317"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/media?parent=198280"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}