{"id":170532,"date":"2023-05-25T07:30:06","date_gmt":"2023-05-25T07:30:06","guid":{"rendered":"\/knowledge\/forums\/topic\/using-ibis-models-in-statistical-analyses-quickeye-and-verifeye\/"},"modified":"2023-07-31T12:34:29","modified_gmt":"2023-07-31T12:34:29","slug":"using-ibis-models-in-statistical-analyses-quickeye-and-verifeye","status":"publish","type":"topic","link":"https:\/\/innovationspace.ansys.com\/knowledge\/forums\/topic\/using-ibis-models-in-statistical-analyses-quickeye-and-verifeye\/","title":{"rendered":"Using IBIS Models in statistical analyses QuickEye and VerifEye"},"content":{"rendered":"

See Attached Documents<\/p>\n

Attachments:
\n1. Using%20IBIS%20Models%20in%20QuickEye%20and%20VerifEye.pdf<\/a><\/p>\n","protected":false},"template":"","class_list":["post-170532","topic","type-topic","status-publish","hentry","topic-tag-designer","topic-tag-electromagnetics-electronics","topic-tag-nexxim"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_wp_page_template":["default"],"_bbp_last_active_time":["05-25-2023 20:20:01"],"_bbp_forum_id":["153856"],"_bbp_author_ip":["209.182.204.162"],"_btv_view_count":["3588"],"siebel_km_number":["2054954"],"product_version":[""],"km_published_date":["2018-06-18T00:00:00.000Z"],"family":["Electromagnetics & Electronics"],"application_name":["Designer"]},"test":"solution"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/170532","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/170532\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/media?parent=170532"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}