{"id":162072,"date":"2023-01-25T07:34:13","date_gmt":"2023-01-25T07:34:13","guid":{"rendered":"\/knowledge\/forums\/topic\/how-can-i-control-the-resolution-of-trace-mapping\/"},"modified":"2023-07-31T12:36:21","modified_gmt":"2023-07-31T12:36:21","slug":"how-can-i-control-the-resolution-of-trace-mapping","status":"publish","type":"topic","link":"https:\/\/innovationspace.ansys.com\/knowledge\/forums\/topic\/how-can-i-control-the-resolution-of-trace-mapping\/","title":{"rendered":"How can I control the resolution of trace mapping?"},"content":{"rendered":"

Keywords: Trace Mapping, resolution, discretization Mapping takes place in two stages. During the first stage, a representation of the layout is built upon a rectangular grid using the data from a specified ECAD layout. The cell size of the grid is governed by the smallest features in the layout that have to be resolved. This size can be controlled by the user and should be specified based on the resolution required. The X-\/Y-Discretization properties under Details of Imported Trace enable you to specify the size of the regular grid. The grid density count is 200 x 200 by default. Depending on the trace resolution and the computational costs desired, you can change the values for the rows and columns to receive optimum results. For accurate results, it is recommended that the X and Y discretization be specified such that the grid cell length be less than or equal to the minimum trace width. The Mechanical mesh size is recommended to be less than 4 times the grid cell length.<\/p>\n","protected":false},"template":"","class_list":["post-162072","topic","type-topic","status-publish","hentry","topic-tag-2019-r1","topic-tag-general","topic-tag-mechanical","topic-tag-structural-mechanics"],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t