{"id":156091,"date":"2022-06-03T13:43:32","date_gmt":"2022-06-03T13:43:32","guid":{"rendered":"\/knowledge\/forums\/topic\/ansys-totem-debugging-ir-drop-issues\/"},"modified":"2022-06-03T13:43:32","modified_gmt":"2022-06-03T13:43:32","slug":"ansys-totem-debugging-ir-drop-issues","status":"publish","type":"topic","link":"https:\/\/innovationspace.ansys.com\/knowledge\/forums\/topic\/ansys-totem-debugging-ir-drop-issues\/","title":{"rendered":"ANSYS Totem: Debugging IR Drop issues"},"content":{"rendered":"<p>&#8220;This video introduces the ANSYS Totem Graphical User Interface (GUI) to help you effectively use the tool to identify and uncover design issues while performing power integrity (IR) analysis . This video highlights basic features of the Totem GUI such as debug maps and reports for identifying and root causing IR drop and EM issues. In addition, it demonstrates Totem\u2019s unique features including Short Path Trace (SPT), net based views, violation cross-probing, region and device based current\/voltage plots, decap views, etc.<br \/>\nhttps:\/\/www.youtube.com\/watch?v=9AGoDIk9QqA&#8221;<\/p>\n","protected":false},"template":"","class_list":["post-156091","topic","type-topic","status-publish","hentry","topic-tag-analog","topic-tag-electromigration","topic-tag-ip","topic-tag-mixed-signal","topic-tag-power-integrity","topic-tag-reliability","topic-tag-voltage-drop"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_wp_page_template":["default"],"_bbp_last_active_time":["06-03-2022 20:20"],"_bbp_forum_id":["153861"],"_bbp_likes_count":["1"],"_btv_view_count":["3139"]},"test":"watchlearnansys-com"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/156091","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/topics\/156091\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/knowledge\/wp-json\/wp\/v2\/media?parent=156091"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}