{"id":396657,"date":"2024-12-07T09:04:02","date_gmt":"2024-12-07T09:04:02","guid":{"rendered":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/how-to-determine-the-position-of-dft-monitor-on-farfield-scattering-analysis\/"},"modified":"2024-12-07T11:38:47","modified_gmt":"2024-12-07T11:38:47","slug":"how-to-determine-the-position-of-dft-monitor-on-farfield-scattering-analysis","status":"publish","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/how-to-determine-the-position-of-dft-monitor-on-farfield-scattering-analysis\/","title":{"rendered":"How to determine the position of DFT monitor on farfield scattering analysis ?"},"content":{"rendered":"<p>&lt;p&gt;&lt;p&gt;Now I try to investigate scattering phenomena of a particle on a substrate.&lt;br&gt;Simulation conditions:&lt;br&gt;Substrate:SiO2&lt;br&gt;Particle:Au&lt;br&gt;Source:TFSF&lt;br&gt;Wavelength:355nm&lt;br&gt;Mesh:uniform, maximum mesh step 8.8nm (defined by sphere override mesh)&lt;br&gt;Geometry information is below screenshots.&lt;\/p&gt;&lt;p&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733559961-mceclip1.png\" width=\"340\" height=\"254\" \/>&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733560172-mceclip2.png\" width=\"340\" height=\"361\" \/>&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733560213-mceclip3.png\" width=\"330\" height=\"328\" \/>&lt;br&gt;And then, I arranged multiple DFT monitors above the source at different height as below screenshot.&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733559836-mceclip0.png\" width=\"467\" height=\"119\" \/>&lt;br&gt;After simulation, I checked farfield E^2 profile and I realized that the profiles were different among monitors. I think the simulation region was large enough and the mesh size was fine enough. However, the higher the position of the monitor, the more discretized the profile was generated. How should I interpret this result? And how should I determine the position of DFT monitor properly? Is there any problem on setting the monitor very close to the scattering body?&lt;br&gt;&lt;br&gt;\u30fb0.5um above substrate&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733561058-mceclip4.png\" width=\"399\" height=\"387\" \/>&lt;br&gt;\u30fb1um&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733561194-mceclip5.png\" width=\"390\" height=\"329\" \/>&lt;br&gt;\u30fb1.5um&lt;br&gt;<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/innovationspace.ansys.com\/forum\/wp-content\/uploads\/sites\/2\/2024\/12\/07-12-2024-1733561270-mceclip6.png\" width=\"394\" height=\"332\" \/>&lt;\/p&gt;&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-396657","topic","type-topic","status-publish","hentry"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_bbp_forum_id":["27833"],"_bbp_topic_id":["396657"],"_bbp_subscription":["467493","473055"],"_bbp_author_ip":["101.110.51.66"],"_bbp_last_reply_id":["397253"],"_bbp_last_active_id":["397253"],"_bbp_last_active_time":["2024-12-12 12:33:48"],"_bbp_reply_count":["7"],"_bbp_reply_count_hidden":["0"],"_bbp_voice_count":["2"],"_bbp_engagement":["467493","473055"],"_btv_view_count":["232"],"_bbp_topic_status":["unanswered"],"_edit_last":["467493"],"_bbp_revision_log":["a:1:{i:396661;a:2:{s:6:\"author\";i:467493;s:6:\"reason\";s:0:\"\";}}"],"_edit_lock":["1733798555:473055"],"_bbp_notification_enabled":["473055"]},"test":"takuya-sobuelasertec-co-jp"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/396657","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":1,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/396657\/revisions"}],"predecessor-version":[{"id":396661,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/396657\/revisions\/396661"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=396657"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}