Dear Experts,<\/p>\n
I have been doing the heat simulation of a certain material layer (material x) on silicon dioxide substrate and the structure is pity simple.Material X is in between the two Ag electrode layer and the total arrangement is on the substrate.I wanted to see the increase in temperate due to the effect of applied voltage inside the material layer x only in order to test the crystallization temperature of that material x.I have build the material in the database by using its thermal datas (such as conductivity , specific heat etc) available in the literature.Even doing everything as per the protocol such as simulation region, Voltage probing, boundary conditions, temperature monitors, I am not getting the accurate values of crystallization temperature that is desired.For my case the crystallization change can be monitored in terms of refractive index variation which can be seen by loading the heat solver data into the Lumerical FDE solver.By lietature the crystallization change should occur at a temperature of around 450K by I am getting it at 365K.Can you please suggest what kind of necessary corrections should be done here? I will look forward to your expert opinion.<\/p>\n
Thanks and regards,<\/p>\n
Anindya Bose<\/p>\n","protected":false},"template":"","class_list":["post-373878","topic","type-topic","status-closed","hentry"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_bbp_subscription":["286417","2592"],"_bbp_author_ip":["117.214.33.38"]," _bbp_last_reply_id":["0"],"_btv_view_count":["111"]," _bbp_likes_count":["0"],"_bbp_topic_status":["unanswered"],"_bbp_topic_id":["373878"],"_bbp_forum_id":["27833"],"_bbp_engagement":["2592","286417"],"_bbp_voice_count":["2"],"_bbp_reply_count":["2"],"_bbp_last_reply_id":["374788"],"_bbp_last_active_id":["374788"],"_bbp_last_active_time":["2024-08-01 21:45:08"]},"test":"anindyaiiita-ac-in"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/373878","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/373878\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=373878"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}