{"id":365284,"date":"2024-05-02T19:51:03","date_gmt":"2024-05-02T19:51:03","guid":{"rendered":"\/forum\/forums\/topic\/farfield-simulation-and-monitors\/"},"modified":"2024-05-02T19:51:03","modified_gmt":"2024-05-02T19:51:03","slug":"farfield-simulation-and-monitors","status":"closed","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/farfield-simulation-and-monitors\/","title":{"rendered":"Farfield simulation and monitors"},"content":{"rendered":"

Hello,<\/p>\n

I have a question related to position of the monitor on the thin film. I am running a simulation using a box of monitors, with the z2 monitor on the surface of my thinfilm as shown below<\/p>\n

<\/p>\n

I have a question related to the position of the z2-monitor above the structure. I am getting different far field field plots for different positions of the z2-monitor above the source. <\/p>\n

But, as I was going through this article “https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034395194-Changing-the-far-field-refractive-index-analysis-object”. As my monitors are on the film, is this farfield analysis group is considering the refractive index of the vaccum or is it extending the substrate to the infinity? So, how can validate my results to see if this method is correct?<\/p>\n

 <\/p>\n

Thanks,<\/p>\n

Prabha<\/p>\n

 <\/p>\n","protected":false},"template":"","class_list":["post-365284","topic","type-topic","status-closed","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t