{"id":358718,"date":"2024-03-25T03:30:36","date_gmt":"2024-03-25T03:30:36","guid":{"rendered":"\/forum\/forums\/topic\/aligning-modeled-and-measured-eye-diagrams-in-channel-analysis\/"},"modified":"2024-03-25T03:30:36","modified_gmt":"2024-03-25T03:30:36","slug":"aligning-modeled-and-measured-eye-diagrams-in-channel-analysis","status":"closed","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/aligning-modeled-and-measured-eye-diagrams-in-channel-analysis\/","title":{"rendered":"Aligning Modeled and Measured Eye Diagrams in Channel Analysis"},"content":{"rendered":"

After modeling connectors, cables, and PCBs using SI wave, Q2D, and HFSS respectively, I extracted S-parameter data from each simulator and used AEDT to generate an integrated channel’s eye diagram. However, when I compared this with the eye diagram extracted from the actual model measured using a network analyzer, I found significant discrepancies. The modeled eye diagram seems to lack consideration for reflections, transmissions, mismatches, etc., making it unrealistic. I’m curious about methods to obtain an eye diagram that closely matches the measured values.<\/p>\n","protected":false},"template":"","class_list":["post-358718","topic","type-topic","status-closed","hentry","topic-tag-aedt","topic-tag-ansys-hfss","topic-tag-ansys-q3d-extractor","topic-tag-AnsysSiwave-1","topic-tag-eye-diagram-2","topic-tag-s-parameter-1"],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t