{"id":320590,"date":"2023-12-03T07:52:33","date_gmt":"2023-12-03T07:52:33","guid":{"rendered":"\/forum\/forums\/topic\/stackrt-method-for-absorption-validation\/"},"modified":"2023-12-03T07:56:12","modified_gmt":"2023-12-03T07:56:12","slug":"stackrt-method-for-absorption-validation","status":"closed","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/stackrt-method-for-absorption-validation\/","title":{"rendered":"Stackrt method for absorption validation"},"content":{"rendered":"

Hi, <\/p>\n

I am simulating this photodiode structure in 3D using FDTD. I would like to use the stackrt<\/strong> command and validate the absorption through the analytic transfer matrix method that the stackrt<\/strong> uses.  I am following the “planar silicon solar cell example” which compares the A=1-R-T simulation result to the stackrt <\/strong>theoretical result. My question is, is the stackrt method valid for this particular structure? The stackrt<\/strong> takes only the thicknesses of the layers into consideration and does not take the lateral shape in the horizontal direction. I mean, it would give the same result for this structure and a similar structure where the silicon is a whole parallelipiped. When I compared simulation and theory I found a big difference that might be due to this fact. If the stackrt<\/strong> is not valid for my structure shape, does Lumerical include a similar method as stackrt <\/strong>that might take the shape of the structure into consideration when calculating the analytic transfer matrix method? <\/p>\n

Thank you. <\/p>\n

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