{"id":307514,"date":"2023-09-19T22:51:39","date_gmt":"2023-09-19T22:51:39","guid":{"rendered":"\/forum\/forums\/topic\/high-quality-factor-dependency-on-numbers-of-frequency-points\/"},"modified":"2023-09-19T22:51:39","modified_gmt":"2023-09-19T22:51:39","slug":"high-quality-factor-dependency-on-numbers-of-frequency-points","status":"closed","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/high-quality-factor-dependency-on-numbers-of-frequency-points\/","title":{"rendered":"High Quality factor dependency on numbers of frequency points"},"content":{"rendered":"<p>Hello there,<\/p>\n<p>I am working on the 1D photonic crystal which I expect to show a quality factor of about 1 million. I used the high q analyzer embedded in Lumerical FDTD.&nbsp;<br \/>I recently found out that the quality factor changes using changing frequency points in the global properties of the &#8220;monitors&#8221; section in the software.<\/p>\n<p>So I simulate my cavity considering random dipole in the region to excite the resonant modes, I am using this method to find the intrinsic quality factor of my structure.&nbsp;<\/p>\n<p>As far as I know, the time monitor which is used in this method to calculate the decay of energy from the cavity is not dependent on the number of frequency points, right?<\/p>\n<p>Would you please guide me, so I can make sure that my simulation is reliable?<\/p>\n","protected":false},"template":"","class_list":["post-307514","topic","type-topic","status-closed","hentry"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_bbp_subscription":["267492","2592","291105"],"_bbp_author_ip":["23.206.193.146"]," _bbp_last_reply_id":["0"]," _bbp_likes_count":["0"],"_btv_view_count":["362"],"_bbp_topic_status":["unanswered"],"_bbp_status":["publish"],"_bbp_topic_id":["307514"],"_bbp_forum_id":["27833"],"_bbp_engagement":["2592","267492","291105"],"_bbp_voice_count":["3"],"_bbp_reply_count":["7"],"_bbp_last_reply_id":["309132"],"_bbp_last_active_id":["309132"],"_bbp_last_active_time":["2023-09-27 16:11:33"]},"test":"sme8gatech-edu"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/307514","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/307514\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=307514"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}