{"id":307015,"date":"2023-09-15T18:33:55","date_gmt":"2023-09-15T18:33:55","guid":{"rendered":"\/forum\/forums\/topic\/cant-observe-interference-effect-in-simulation\/"},"modified":"2023-09-15T18:33:55","modified_gmt":"2023-09-15T18:33:55","slug":"cant-observe-interference-effect-in-simulation","status":"closed","type":"topic","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/topic\/cant-observe-interference-effect-in-simulation\/","title":{"rendered":"can’t observe interference effect in simulation"},"content":{"rendered":"

Hi,<\/p>\n

I can’t observe high oscillation in reflectance spectrum of TSV due to  interference effect. In real experiment, To measure hole depth in a structure it’s reflection is measured which has high frequency oscillations. The height can be measured by using DFT. I am not getting similar oscillation in simulation. The reflection spectra in lumerical simulation is very smooth. what could be the reason? <\/p>\n

Image Source: A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon <\/span>Vias<\/span> for Realization of Smart Devices<\/span><\/p>\n

https:\/\/doi.org\/10.1038\/s41598-018-33728-w<\/span><\/p>\n

 <\/p>\n

thank you<\/span><\/p>\n","protected":false},"template":"","class_list":["post-307015","topic","type-topic","status-closed","hentry"],"aioseo_notices":[],"acf":[],"custom_fields":[{"0":{"_bbp_subscription":["283682","2592"],"_bbp_author_ip":["96.7.218.215"]," _bbp_last_reply_id":["0"]," _bbp_likes_count":["0"],"_btv_view_count":["244"],"_bbp_topic_status":["unanswered"],"_bbp_status":["publish"],"_bbp_topic_id":["307015"],"_bbp_forum_id":["27833"],"_bbp_engagement":["2592","283682"],"_bbp_voice_count":["2"],"_bbp_reply_count":["5"],"_bbp_last_reply_id":["309343"],"_bbp_last_active_id":["309343"],"_bbp_last_active_time":["2023-09-28 20:43:48"]},"test":"t109618404ntut-edu-tw"}],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/307015","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/topic"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/topics\/307015\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=307015"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}