{"id":382050,"date":"2024-09-09T19:24:56","date_gmt":"2024-09-09T19:24:56","guid":{"rendered":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/382050\/"},"modified":"2024-09-09T19:24:56","modified_gmt":"2024-09-09T19:24:56","slug":"382050","status":"publish","type":"reply","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/382050\/","title":{"rendered":"Reply To: \u5173\u4e8e\u5468\u671f\u7ed3\u6784\u4e2d\u7f3a\u9677\u68c0\u6d4b\u4eff\u771f"},"content":{"rendered":"<p>&lt;p&gt;\u8bf7\u53c2\u8003&lt;\/p&gt;&lt;p&gt;<a href=\"https:\/\/optics.ansys.com\/hc\/en-us\/search\/click?data=BAh7DjoHaWRsKwhqZinUUwA6D2FjY291bnRfaWRpA02AjDoJdHlwZUkiDGFydGljbGUGOgZFVDoIdXJsSSJeaHR0cHM6Ly9vcHRpY3MuYW5zeXMuY29tL2hjL2VuLXVzL2FydGljbGVzLzM2MDA0MTc2ODU1NC1PcHRpY2FsLURlZmVjdC1NZXRyb2xvZ3ktUy1NYXRyaXgGOwhUOg5zZWFyY2hfaWRJIiliYzllNjdmYi0yMjE0LTRhNzYtYmRiZC0xYzg0YTI2NDU4ZDMGOwhGOglyYW5raQk6C2xvY2FsZUkiCmVuLXVzBjsIVDoKcXVlcnlJIgtkZWZlY3QGOwhUOhJyZXN1bHRzX2NvdW50aTA%3D--d8e36a6c65174e375c6ea0c0076320221884faaf\">Optical Defect Metrology (S-Matrix)<\/a>&lt;\/p&gt;&lt;p&gt;<a href=\"https:\/\/optics.ansys.com\/hc\/en-us\/search\/click?data=BAh7DjoHaWRsKwiqU87UUwA6D2FjY291bnRfaWRpA02AjDoJdHlwZUkiDGFydGljbGUGOgZFVDoIdXJsSSJnaHR0cHM6Ly9vcHRpY3MuYW5zeXMuY29tL2hjL2VuLXVzL2FydGljbGVzLzM2MDA1MjU3NzE5NC1PcHRpY2FsLURlZmVjdC1NZXRyb2xvZ3ktRGlyZWN0LVNpbXVsYXRpb24GOwhUOg5zZWFyY2hfaWRJIiliYzllNjdmYi0yMjE0LTRhNzYtYmRiZC0xYzg0YTI2NDU4ZDMGOwhGOglyYW5raQg6C2xvY2FsZUkiCmVuLXVzBjsIVDoKcXVlcnlJIgtkZWZlY3QGOwhUOhJyZXN1bHRzX2NvdW50aTA%3D--c4cd8b8c9d061f2c89671ea8b2e9da2b2220cea4\">Optical Defect Metrology (Direct Simulation)<\/a>&lt;\/p&gt;&lt;p&gt;<a href=\"https:\/\/optics.ansys.com\/hc\/en-us\/search\/click?data=BAh7DjoHaWRsKwgNkzDUUwA6D2FjY291bnRfaWRpA02AjDoJdHlwZUkiDGFydGljbGUGOgZFVDoIdXJsSSJjaHR0cHM6Ly9vcHRpY3MuYW5zeXMuY29tL2hjL2VuLXVzL2FydGljbGVzLzM2MDA0MjIzODczMy1PcHRpY2FsLU1ldHJvbG9neS1TLU1hdHJpeC1NZXRob2RvbG9neQY7CFQ6DnNlYXJjaF9pZEkiKWJjOWU2N2ZiLTIyMTQtNGE3Ni1iZGJkLTFjODRhMjY0NThkMwY7CEY6CXJhbmtpDToLbG9jYWxlSSIKZW4tdXMGOwhUOgpxdWVyeUkiC2RlZmVjdAY7CFQ6EnJlc3VsdHNfY291bnRpMA%3D%3D--47cb8b0e63c5361b30c21c8703573f88d01c09ca\">Optical Metrology &#8211; S-Matrix Methodology<\/a>&nbsp;&lt;\/p&gt;&lt;p&gt;<a href=\"https:\/\/optics.ansys.com\/hc\/en-us\/search\/click?data=BAh7DjoHaWRsKwgaMjDUUwA6D2FjY291bnRfaWRpA02AjDoJdHlwZUkiDGFydGljbGUGOgZFVDoIdXJsSSJcaHR0cHM6Ly9vcHRpY3MuYW5zeXMuY29tL2hjL2VuLXVzL2FydGljbGVzLzM2MDA0MjIxMzkxNC1EZWZlY3Qtc2NhdHRlcmluZy1hbmQtZGV0ZWN0aW9uBjsIVDoOc2VhcmNoX2lkSSIpYmM5ZTY3ZmItMjIxNC00YTc2LWJkYmQtMWM4NGEyNjQ1OGQzBjsIRjoJcmFua2kHOgtsb2NhbGVJIgplbi11cwY7CFQ6CnF1ZXJ5SSILZGVmZWN0BjsIVDoScmVzdWx0c19jb3VudGkw--23aea139f9ac880961c183eacfb662d087211ca5\">Defect scattering and detection<\/a>&lt;\/p&gt;&lt;p&gt;<a href=\"https:\/\/optics.ansys.com\/hc\/en-us\/search\/click?data=BAh7DjoHaWRsKwgOlSnUUwA6D2FjY291bnRfaWRpA02AjDoJdHlwZUkiDGFydGljbGUGOgZFVDoIdXJsSSJWaHR0cHM6Ly9vcHRpY3MuYW5zeXMuY29tL2hjL2VuLXVzL2FydGljbGVzLzM2MDA0MTc4MDQ5NC1EZWZlY3Qtb24tYS1tZXRhbC1zdXJmYWNlBjsIVDoOc2VhcmNoX2lkSSIpYmM5ZTY3ZmItMjIxNC00YTc2LWJkYmQtMWM4NGEyNjQ1OGQzBjsIRjoJcmFua2kGOgtsb2NhbGVJIgplbi11cwY7CFQ6CnF1ZXJ5SSILZGVmZWN0BjsIVDoScmVzdWx0c19jb3VudGkw--02ae5d12e38b02b9f54682fb29aa49a2cf60515d\">Defect on a metal surface<\/a>&lt;\/p&gt;&lt;p&gt;&nbsp;&lt;\/p&gt;&lt;p&gt;&nbsp;&lt;\/p&gt;&lt;p&gt;&nbsp;&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-382050","reply","type-reply","status-publish","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.10 - 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