{"id":365472,"date":"2024-05-03T18:33:18","date_gmt":"2024-05-03T18:33:18","guid":{"rendered":"\/forum\/forums\/reply\/365472\/"},"modified":"2024-05-03T18:33:18","modified_gmt":"2024-05-03T18:33:18","slug":"365472","status":"publish","type":"reply","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/365472\/","title":{"rendered":"Reply To: Farfield simulation and monitors"},"content":{"rendered":"<p>&lt;p&gt;As mentioned previously, when a monitor is exactly on the interface, it may pick up data from two different materials, due to discretization. Therefore it is not suggested doing so.&lt;\/p&gt;&lt;p&gt;When refractive index is invloved, it will use the refractive index at the center of the monitor. However such farfield will NOT be able being validated through experiments since the monitors are inside the material, and it will assume that the far field is inside such material, not in the backgound vacuum.&lt;\/p&gt;&lt;p&gt;Please reconsider the physics: does the bottom monitor contribute to the farfield in upper half space? how can you measure such farfield in experiment?&nbsp; what is the purpose for such projection? when there is substrate, one can measure the farfield in the upper semisphere (in air). Then you can use 5 monitors in air to pick up the radiation and do the farfield projection, without simulating large area with one single monitor.&nbsp;&lt;\/p&gt;&lt;p&gt;When the substrate has been extended to the outside of the bottome PML, it assumes the substrate is semi-infinity.&nbsp;&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-365472","reply","type-reply","status-publish","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.10 - aioseo.com -->\n\t<meta name=\"description\" content=\"As mentioned previously, when a monitor is exactly on the interface, it may pick up data from two different materials, due to discretization. Therefore it is not suggested doing so.When refractive index is invloved, it will use the refractive index at the center of the monitor. However such farfield will NOT be able being validated\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<link rel=\"canonical\" href=\"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/365472\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.10\" \/>\n\t\t<meta property=\"og:locale\" content=\"en_US\" \/>\n\t\t<meta property=\"og:site_name\" content=\"Ansys Learning Forum | Ansys Innovation Space\" \/>\n\t\t<meta property=\"og:type\" content=\"article\" \/>\n\t\t<meta property=\"og:title\" content=\"Reply To: Farfield simulation and monitors | Ansys Learning Forum\" \/>\n\t\t<meta property=\"og:description\" content=\"As mentioned previously, when a monitor is exactly on the interface, it may pick up data from two different materials, due to discretization. Therefore it is not suggested doing so.When refractive index is invloved, it will use the refractive index at the center of the monitor. 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