


{"id":358888,"date":"2024-03-25T21:24:10","date_gmt":"2024-03-25T21:24:10","guid":{"rendered":"\/forum\/forums\/reply\/358888\/"},"modified":"2024-03-25T21:24:10","modified_gmt":"2024-03-25T21:24:10","slug":"358888","status":"publish","type":"reply","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/358888\/","title":{"rendered":"Reply To: Information regarding the measurement of Phase spectrum in FDTD"},"content":{"rendered":"<p>&lt;p&gt;I am not quite sure what exactly you want to get. you want to get &#8220;phase spectrum as a funtion of refractive index&#8221;? usually the phase and the refractive index is a function of frequency or wavelength. Since both can be nonlinear and monotonically change, I am not sure if you can use refractive index as the absissa. Once you get both of them as a function of frequency\/wavelength, you could try to plot phase as a function of refractive index (most likely the real part).&lt;\/p&gt;&lt;p&gt;probably you can sweep refractive index, could you later find a material with specified reftractive index as the function of frequency?&lt;\/p&gt;&lt;p&gt;If you want to see the map of phase vs frequency and swept refrative index, you can image them:&lt;\/p&gt;&lt;p&gt;image(f,index,phase)&lt;\/p&gt;&lt;p&gt;where f is the frequency of the source;&lt;\/p&gt;&lt;p&gt;index is what you swept;&lt;\/p&gt;&lt;p&gt;phase is what you get from a monitor, most likely it is a line monitor. If it is 2D monitor, then you will have 3D matrix result that cannot be directly imaged.&lt;\/p&gt;&lt;p&gt;Phase is always associated with field components. For example, if you want to get phse of Ex from a xy plane monitor , you can&lt;\/p&gt;&lt;p&gt;E=getresult(&#8220;monitor&#8221;,&#8221;E&#8221;);&lt;\/p&gt;&lt;p&gt;x=E.x;&lt;\/p&gt;&lt;p&gt;y=E.y;&lt;\/p&gt;&lt;p&gt;f=E.f;&lt;\/p&gt;&lt;p&gt;Ex=E.Ex;&lt;\/p&gt;&lt;p&gt;phase_x=pinch(angle(Ex)));&lt;\/p&gt;&lt;p&gt;then phase_x will be a function of x,y and f.&lt;\/p&gt;&lt;p&gt;Please try.&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-358888","reply","type-reply","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies\/358888","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/reply"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies\/358888\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=358888"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}