{"id":358797,"date":"2024-03-25T13:25:29","date_gmt":"2024-03-25T13:25:29","guid":{"rendered":"\/forum\/forums\/reply\/358797\/"},"modified":"2024-03-25T13:25:29","modified_gmt":"2024-03-25T13:25:29","slug":"358797","status":"publish","type":"reply","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/358797\/","title":{"rendered":"Reply To: Aligning Modeled and Measured Eye Diagrams in Channel Analysis"},"content":{"rendered":"<p>&lt;p&gt;&lt;span style=&#8221;font-size: 12pt;&#8221;&gt;When you extracted the various models, were they all at nominal conditions, or are you simulating across manufacturing process corners? Even if you just consider the effects of manufacturing on characteristic impedances, a single eye diagram simulation with all models at their nominal impedance is going to be something of a best case scenario. You may want to consider taking a design of experiments approach where you have multiple versions of each model&nbsp; to account for that process cornering and set up a series of sweeps to include all of the potetnial scenarios.&nbsp;&lt;\/span&gt;&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-358797","reply","type-reply","status-publish","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.10 - aioseo.com -->\n\t<meta name=\"description\" content=\"When you extracted the various models, were they all at nominal conditions, or are you simulating across manufacturing process corners? Even if you just consider the effects of manufacturing on characteristic impedances, a single eye diagram simulation with all models at their nominal impedance is going to be something of a best case\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<link rel=\"canonical\" href=\"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/358797\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.10\" \/>\n\t\t<meta property=\"og:locale\" content=\"en_US\" \/>\n\t\t<meta property=\"og:site_name\" content=\"Ansys Learning Forum | Ansys Innovation Space\" \/>\n\t\t<meta property=\"og:type\" content=\"article\" \/>\n\t\t<meta property=\"og:title\" content=\"Reply To: Aligning Modeled and Measured Eye Diagrams in Channel Analysis | Ansys Learning Forum\" \/>\n\t\t<meta property=\"og:description\" content=\"When you extracted the various models, were they all at nominal conditions, or are you simulating across manufacturing process corners? Even if you just consider the effects of manufacturing on characteristic impedances, a single eye diagram simulation with all models at their nominal impedance is going to be something of a best case\" \/>\n\t\t<meta property=\"og:url\" content=\"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/358797\/\" \/>\n\t\t<meta property=\"article:published_time\" content=\"2024-03-25T13:25:29+00:00\" \/>\n\t\t<meta property=\"article:modified_time\" content=\"2024-03-25T13:25:29+00:00\" \/>\n\t\t<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n\t\t<meta name=\"twitter:title\" content=\"Reply To: Aligning Modeled and Measured Eye Diagrams in Channel Analysis | Ansys Learning Forum\" \/>\n\t\t<meta name=\"twitter:description\" content=\"When you extracted the various models, were they all at nominal conditions, or are you simulating across manufacturing process corners? 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