{"id":223159,"date":"2022-08-03T14:57:00","date_gmt":"2022-08-03T14:57:00","guid":{"rendered":"\/forum\/forums\/reply\/223159\/"},"modified":"2022-08-03T14:57:00","modified_gmt":"2022-08-03T14:57:00","slug":"223159","status":"publish","type":"reply","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/","title":{"rendered":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f"},"content":{"rendered":"<p>&lt;p&gt;\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002&lt;\/p&gt;&lt;p&gt;Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab&lt;\/p&gt;&lt;p&gt;&nbsp;&lt;\/p&gt;&lt;p&gt;EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002&lt;\/p&gt;&lt;p&gt;\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1a&lt;\/p&gt;&lt;p&gt;https:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approach&lt;\/p&gt;&lt;p&gt;https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations&lt;\/p&gt;&lt;p&gt;&nbsp;&lt;\/p&gt;<\/p>\n","protected":false},"template":"","class_list":["post-223159","reply","type-reply","status-publish","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.10 - aioseo.com -->\n\t<meta name=\"description\" content=\"\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<link rel=\"canonical\" href=\"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 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EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations\" \/>\n\t\t<meta property=\"og:url\" content=\"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/\" \/>\n\t\t<meta property=\"article:published_time\" content=\"2022-08-03T14:57:00+00:00\" \/>\n\t\t<meta 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EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations\" \/>\n\t\t<script type=\"application\/ld+json\" class=\"aioseo-schema\">\n\t\t\t{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/#breadcrumblist\",\"itemListElement\":[{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum#listItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/#listItem\",\"name\":\"Reply To: \\u7aef\\u9762\\u8026\\u5408\\u5668\\u4eff\\u771f\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/#listItem\",\"position\":2,\"name\":\"Reply To: \\u7aef\\u9762\\u8026\\u5408\\u5668\\u4eff\\u771f\",\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum#listItem\",\"name\":\"Home\"}}]},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/#organization\",\"name\":\"Ansys Learning Forum\",\"description\":\"Ansys Innovation Space\",\"url\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/#webpage\",\"url\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/\",\"name\":\"Reply To: \\u7aef\\u9762\\u8026\\u5408\\u5668\\u4eff\\u771f | Ansys Learning Forum\",\"description\":\"\\u8fd9\\u4e2a\\u5e16\\u5b50\\u7684\\u56de\\u590d\\u6ca1\\u6709\\u6210\\u529f\\u3002Overlap\\u662f\\u8026\\u5408\\u6548\\u7387\\u7684\\u4e00\\u79cd\\u4f30\\u8ba1\\uff0c\\u5e76\\u4e0d\\u662f\\u5b8c\\u5168\\u6b63\\u786e\\u7684\\uff0c\\u5b83\\u6709\\u51e0\\u4e2a\\u8fd1\\u4f3c\\u548c\\u5047\\u8bbe\\uff0c\\u53c2\\u89c1 https:\\\/\\\/optics.ansys.com\\\/hc\\\/en-us\\\/articles\\\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\\u4eff\\u771f\\u7ed3\\u679c\\u53d6\\u51b3\\u4e8e\\u4f60\\u7684\\u8bbe\\u7f6e\\u548c\\u6a21\\u5f0f\\u4e2a\\u6570\\uff0c\\u751a\\u81f3Cell\\u4e2a\\u6570\\uff0c\\u5982\\u679c\\u6ce2\\u5bfc\\u4e0d\\u662f\\u5747\\u5300\\u7684\\u8bdd\\u3002\\u6309\\u7406EME\\u7684\\u7ed3\\u679c\\u5c31\\u662f\\u771f\\u6b63\\u7684\\u8026\\u5408\\u6548\\u7387\\uff0c\\u524d\\u63d0\\u662f\\u8003\\u8651\\u4e86\\u6240\\u6709\\u4e3b\\u8981\\u7684\\u53cd\\u5c04\\u548c\\u900f\\u5c04\\u6a21\\u5f0f\\uff0c\\u8026\\u5408\\u8fc7\\u7a0b\\u4ea7\\u751f\\u5f88\\u5c11\\u7684\\u8f90\\u5c04\\u6a21\\u3002\\u9700\\u8981\\u6536\\u655b\\u6027\\u6d4b\\u8bd5\\uff1ahttps:\\\/\\\/optics.ansys.com\\\/hc\\\/en-us\\\/articles\\\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\\\/\\\/optics.ansys.com\\\/hc\\\/en-us\\\/articles\\\/360037172994-Convergence-testing-process-for-EME-simulations\",\"inLanguage\":\"en-US\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/#website\"},\"breadcrumb\":{\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/forums\\\/reply\\\/223159\\\/#breadcrumblist\"},\"datePublished\":\"2022-08-03T14:57:00+00:00\",\"dateModified\":\"2022-08-03T14:57:00+00:00\"},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/#website\",\"url\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/\",\"name\":\"Ansys Learning Forum\",\"description\":\"Ansys Innovation Space\",\"inLanguage\":\"en-US\",\"publisher\":{\"@id\":\"https:\\\/\\\/innovationspace.ansys.com\\\/forum\\\/#organization\"}}]}\n\t\t<\/script>\n\t\t<!-- All in One SEO -->\n\n","aioseo_head_json":{"title":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f | Ansys Learning Forum","description":"\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations","canonical_url":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/","robots":"max-image-preview:large","keywords":"","webmasterTools":{"miscellaneous":""},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"BreadcrumbList","@id":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/#breadcrumblist","itemListElement":[{"@type":"ListItem","@id":"https:\/\/innovationspace.ansys.com\/forum#listItem","position":1,"name":"Home","item":"https:\/\/innovationspace.ansys.com\/forum","nextItem":{"@type":"ListItem","@id":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/#listItem","name":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f"}},{"@type":"ListItem","@id":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/#listItem","position":2,"name":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f","previousItem":{"@type":"ListItem","@id":"https:\/\/innovationspace.ansys.com\/forum#listItem","name":"Home"}}]},{"@type":"Organization","@id":"https:\/\/innovationspace.ansys.com\/forum\/#organization","name":"Ansys Learning Forum","description":"Ansys Innovation Space","url":"https:\/\/innovationspace.ansys.com\/forum\/"},{"@type":"WebPage","@id":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/#webpage","url":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/","name":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f | Ansys Learning Forum","description":"\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations","inLanguage":"en-US","isPartOf":{"@id":"https:\/\/innovationspace.ansys.com\/forum\/#website"},"breadcrumb":{"@id":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/#breadcrumblist"},"datePublished":"2022-08-03T14:57:00+00:00","dateModified":"2022-08-03T14:57:00+00:00"},{"@type":"WebSite","@id":"https:\/\/innovationspace.ansys.com\/forum\/#website","url":"https:\/\/innovationspace.ansys.com\/forum\/","name":"Ansys Learning Forum","description":"Ansys Innovation Space","inLanguage":"en-US","publisher":{"@id":"https:\/\/innovationspace.ansys.com\/forum\/#organization"}}]},"og:locale":"en_US","og:site_name":"Ansys Learning Forum | Ansys Innovation Space","og:type":"article","og:title":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f | Ansys Learning Forum","og:description":"\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations","og:url":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/","article:published_time":"2022-08-03T14:57:00+00:00","article:modified_time":"2022-08-03T14:57:00+00:00","twitter:card":"summary_large_image","twitter:title":"Reply To: \u7aef\u9762\u8026\u5408\u5668\u4eff\u771f | Ansys Learning Forum","twitter:description":"\u8fd9\u4e2a\u5e16\u5b50\u7684\u56de\u590d\u6ca1\u6709\u6210\u529f\u3002Overlap\u662f\u8026\u5408\u6548\u7387\u7684\u4e00\u79cd\u4f30\u8ba1\uff0c\u5e76\u4e0d\u662f\u5b8c\u5168\u6b63\u786e\u7684\uff0c\u5b83\u6709\u51e0\u4e2a\u8fd1\u4f3c\u548c\u5047\u8bbe\uff0c\u53c2\u89c1 https:\/\/optics.ansys.com\/hc\/en-us\/articles\/360034917453-Overlap-analysis-Modal-Analysis-Tab EME\u4eff\u771f\u7ed3\u679c\u53d6\u51b3\u4e8e\u4f60\u7684\u8bbe\u7f6e\u548c\u6a21\u5f0f\u4e2a\u6570\uff0c\u751a\u81f3Cell\u4e2a\u6570\uff0c\u5982\u679c\u6ce2\u5bfc\u4e0d\u662f\u5747\u5300\u7684\u8bdd\u3002\u6309\u7406EME\u7684\u7ed3\u679c\u5c31\u662f\u771f\u6b63\u7684\u8026\u5408\u6548\u7387\uff0c\u524d\u63d0\u662f\u8003\u8651\u4e86\u6240\u6709\u4e3b\u8981\u7684\u53cd\u5c04\u548c\u900f\u5c04\u6a21\u5f0f\uff0c\u8026\u5408\u8fc7\u7a0b\u4ea7\u751f\u5f88\u5c11\u7684\u8f90\u5c04\u6a21\u3002\u9700\u8981\u6536\u655b\u6027\u6d4b\u8bd5\uff1ahttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/4412892724243-EME-Convergence-Testing-An-Intuitive-Approachhttps:\/\/optics.ansys.com\/hc\/en-us\/articles\/360037172994-Convergence-testing-process-for-EME-simulations"},"aioseo_meta_data":{"post_id":"223159","title":null,"description":null,"keywords":null,"keyphrases":null,"primary_term":null,"canonical_url":null,"og_title":null,"og_description":null,"og_object_type":"default","og_image_type":"content","og_image_url":null,"og_image_width":null,"og_image_height":null,"og_image_custom_url":null,"og_image_custom_fields":null,"og_video":null,"og_custom_url":null,"og_article_section":null,"og_article_tags":null,"twitter_use_og":true,"twitter_card":"default","twitter_image_type":"default","twitter_image_url":null,"twitter_image_custom_url":null,"twitter_image_custom_fields":null,"twitter_title":null,"twitter_description":null,"schema":{"blockGraphs":[],"customGraphs":[],"default":{"data":{"Article":[],"Course":[],"Dataset":[],"FAQPage":[],"Movie":[],"Person":[],"Product":[],"ProductReview":[],"Car":[],"Recipe":[],"Service":[],"SoftwareApplication":[],"WebPage":[]},"graphName":"","isEnabled":true},"graphs":[]},"schema_type":"default","schema_type_options":null,"pillar_content":false,"robots_default":true,"robots_noindex":false,"robots_noarchive":false,"robots_nosnippet":false,"robots_nofollow":false,"robots_noimageindex":false,"robots_noodp":false,"robots_notranslate":false,"robots_max_snippet":null,"robots_max_videopreview":null,"robots_max_imagepreview":"large","priority":null,"frequency":null,"local_seo":null,"limit_modified_date":false,"created":"2024-10-28 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\u7aef\u9762\u8026\u5408\u5668\u4eff\u771f","link":"https:\/\/innovationspace.ansys.com\/forum\/forums\/reply\/223159\/"}],"acf":[],"_links":{"self":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies\/223159","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies"}],"about":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/types\/reply"}],"version-history":[{"count":0,"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/replies\/223159\/revisions"}],"wp:attachment":[{"href":"https:\/\/innovationspace.ansys.com\/forum\/wp-json\/wp\/v2\/media?parent=223159"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}